@Article{MurataFeLaCaPiMe:2014:PePrDe,
author = "Murata, Camila H. and Fernandes, Diego Camilo and
Lav{\'{\i}}nia, N. C. and Caldas, L. V. E. and Pires, S. R. and
Medeiros, R. B.",
affiliation = "Coordenadoria de F{\'{\i}}sica e Higiene das
Radia{\c{c}}{\~o}es (CFHR), Departamento de Diagn{\'o}stico por
Imagem, Universidade Federal de S{\~a}o Paulo and {Instituto
Nacional de Pesquisas Espaciais (INPE)} and {Mosaico Ind. e Com
Eletro Eletr{\^o}nico Ltda; Santo Andr{\'e}} and {Instituto de
Pesquisas Energ{\'e}ticas e Nucleares (IPEN)} and {Universidade
Federal de S{\~a}o Paulo} and {Universidade Federal de S{\~a}o
Paulo}",
title = "The performance of a prototype device designed to evaluate general
quality parameters of X-ray equipment",
journal = "Radiation Physics and Chemistry",
year = "2014",
volume = "95",
pages = "101–105",
month = "Feb.",
note = "{Proceedings of the 12th International Symposium on Radiation
Physics (ISRP 2012)}",
keywords = "multifunction X-Ray analysis system, solid state detector,
ionizing chamber, quality control tests.",
abstract = "The performance of radiological equipment can be assessed using
non-invasive methods and portable instruments that can analyze an
X-ray beam with just one exposure. These instruments use either an
ionization chamber or a state solid detector (SSD) to evaluate
X-ray beam parameters. In Brazil, no such instruments are
currently being manufactured; consequently, these instruments come
at a higher cost to users due to importation taxes. Additionally,
quality control tests are time consuming and impose a high
workload on the X-ray tubes when evaluating their performance
parameters. The assessment of some parameters, such as the
half-value layer (HVL), requires several exposures; however, this
can be reduced by using a SSD that requires only a single
exposure. One such SSD uses photodiodes designed for high X-ray
sensitivity without the use of scintillation crystals. This
sensitivity allows one electron-hole pair to be created per 3.63
eV of incident energy, resulting in extremely high and stable
quantum efficiencies. These silicon photodiodes operate by
absorbing photons and generating a flow of current that is
proportional to the incident power. The aim of this study was to
show the response of the solid sensor PIN RD100A detector in a
multifunctional X-ray analysis system that is designed to evaluate
the average peak voltage (kVp), exposure time, and HVL of
radiological equipment. For this purpose, a prototype board that
uses four SSDs was developed to measure kVp, exposure time, and
HVL using a single exposure. The reproducibility and accuracy of
the results were compared to that of different X-ray beam analysis
instruments. The kVp reproducibility and accuracy results were 2%
and 3%, respectively; the exposure time reproducibility and
accuracy results were 2% and 1%, respectively; and the HVL
accuracy was ±2%. The prototype's methodology was able to
calculate these parameters with appropriate reproducibility and
accuracy. Therefore, the prototype can be considered a
multifunctional instrument that can appropriately evaluate the
performance of radiological equipment.",
doi = "10.1016/j.radphyschem.2013.03.041",
url = "http://dx.doi.org/10.1016/j.radphyschem.2013.03.041",
issn = "0969-806X",
label = "lattes: 7511006554286037 2 MurataFeLaCaPiMe:2013:PePrDe",
language = "en",
targetfile = "1-s2.0-S0969806X13001758-main.pdf",
url = "http://dx.doi.org/10.1016/j.radphyschem.2013.03.041",
urlaccessdate = "28 abr. 2024"
}